Sample-based software defect prediction with active and semi-supervised learning.
Ming LiHongyu ZhangRongxin WuZhi-Hua ZhouPublished in: Autom. Softw. Eng. (2012)
Keyphrases
- semi supervised learning
- software defect prediction
- unlabeled data
- ensemble learning
- semi supervised
- sample selection bias
- labeled data
- supervised learning
- machine learning
- unsupervised learning
- active learning
- training data
- class imbalance
- co training
- text categorization
- sample size
- learning problems
- labeled training data
- neural network
- transfer learning
- data mining
- data points
- labeled and unlabeled data
- feature selection
- learning algorithm