An approximation of semiconductor device by mixed finite element method and characteristics-mixed finite element method.
Qing YangYirang YuanPublished in: Appl. Math. Comput. (2013)
Keyphrases
- finite element method
- finite element
- numerical simulations
- numerical solution
- numerical methods
- diffuse optical tomography
- boundary conditions
- temperature field
- boundary element method
- finite element model
- finite difference method
- heat transfer
- genetic algorithm
- high resolution
- np hard
- partial differential equations