Test Structure for Characterization of Low-Frequency Noise in CMOS Technologies.

Chengqing Wei Yong-Zhong Xiong Xing Zhou

Published in: IEEE Trans. Instrum. Meas. (2010)

Keyphrases

low frequency
high frequency
frequency domain
wavelet transform
subband
wavelet analysis
electromagnetic fields
discrete wavelet transform
low pass
power consumption
image structure
original images
low and high frequency
wavelet coefficients
high speed
multiresolution
image sensor
high pass