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AxFTL: Exploiting Error Tolerance for Extending Lifetime of NAND Flash Storage.

Yongwoo LeeJaehyun ParkJunhee RyuYounghyun Kim
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2020)
Keyphrases
  • error tolerance
  • flash memory
  • disk drives
  • storage devices
  • foreseeable future
  • file system
  • solid state
  • data storage
  • main memory
  • storage systems
  • random access
  • embedded systems
  • objective function