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An area-efficient, standard-cell based on-chip NMOS and PMOS performance monitor for process variability compensation.

Toshiyuki YamagishiTatsuo ShiozawaKoji HorisakiHiroyuki HaraYasuo Unekawa
Published in: COOL Chips (2012)
Keyphrases
  • low cost
  • computationally efficient
  • database
  • data mining
  • artificial intelligence
  • knowledge base
  • case study
  • process model
  • monitoring system
  • cost effective