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An area-efficient, standard-cell based on-chip NMOS and PMOS performance monitor for process variability compensation.
Toshiyuki Yamagishi
Tatsuo Shiozawa
Koji Horisaki
Hiroyuki Hara
Yasuo Unekawa
Published in:
COOL Chips (2012)
Keyphrases
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low cost
computationally efficient
database
data mining
artificial intelligence
knowledge base
case study
process model
monitoring system
cost effective