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High voltage applications and NBTI effects of DT-pMOSFETS with reverse Schottky substrate contacts.

Yao-Jen LeeTien-Sheng ChaoTiao-Yuan Huang
Published in: Microelectron. Reliab. (2005)
Keyphrases
  • high voltage
  • operating conditions
  • partial discharge
  • real time
  • support vector
  • normal operation
  • data sets
  • neural network
  • genetic algorithm
  • k means
  • multi class