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Wavelet decomposition and reconstruction-based INL method for testing high-precision ADC.

Xiaohui GuoXu YanShimin MaXinyi ZhangZiaho YanAnqi ZhangKai XuLiangping HuaYan DuHao WangYuxin ShuWeiqiang HongYunong ZhaoYaohua Xu
Published in: Microelectron. J. (2023)
Keyphrases
  • high precision
  • high recall
  • wavelet decomposition
  • high accuracy
  • multiscale
  • multiresolution
  • wavelet transformation
  • three dimensional
  • similarity measure
  • computer vision
  • image reconstruction