Fast and Automated Electromigration Analysis for CMOS RF PA Design.

Junjie Gu Haipeng Fu Weicong Na Qijun Zhang Jianguo Ma

Published in: J. Electron. Test. (2017)

Keyphrases

neural network
design process
data sets
detailed design
engineering design
design space
database
image processing
website
case study
data analysis
evolutionary algorithm
active learning
artificial intelligence
quantitative analysis
design decisions
semi automated