Good Fit Bad Policy: Why Fit Statistics Are a Biased Measure of Knowledge Tracer Quality.
Napol RachatasumritDaniel Weitekamp IIIKenneth R. KoedingerPublished in: AIED Companion (2) (2024)
Keyphrases
- knowledge base
- expert systems
- prior knowledge
- knowledge management
- knowledge representation
- domain knowledge
- information technology
- objective measures
- knowledge extraction
- data mining techniques
- knowledge discovery
- high quality
- social networks
- machine learning
- neural network
- databases
- distance measure
- domain experts
- knowledge sharing
- data sets
- higher quality
- real time