A New Algorithm for the Selection of Control Cells in Boundary-Scan Interconnect Test.
Ángel Quirós-OlozábalMa de los Ángeles Cifredo ChacónPublished in: J. Electron. Test. (2009)
Keyphrases
- selection algorithm
- k means
- preprocessing
- learning algorithm
- optimization algorithm
- control system
- optimal solution
- improved algorithm
- detection algorithm
- expectation maximization
- computational complexity
- times faster
- recognition algorithm
- clustering method
- dynamic programming
- computational cost
- high accuracy
- theoretical analysis
- computationally efficient
- worst case
- cost function
- search space
- objective function
- similarity measure
- linear programming
- data sets
- mathematical model
- matching algorithm
- image sequences
- control method
- single scan