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A 12-bit 8GS/s RF Sampling DAC with Code-Dependent Nonlinearity Compensation and Intersegmental Current-Mismatch Calibration in 5nm FinFET.

Byeongwoo KooSunghan DoSang-Pil NamHeewook ShinSungno LeeEunhye OhJaemin HongJung-Ho LeeYoungjae ChoMichael ChoiJongshin Shin
Published in: VLSI Technology and Circuits (2022)
Keyphrases
  • random sampling
  • relevance feedback
  • sample size
  • sampling algorithm
  • error correcting codes
  • magnetic tape