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Multi-histogram ADC BIST System for ADC Linearity Testing.

Koay Soon ChanNuzrul Fahmi NordinKim Chon ChanTerk Zyou LokChee Wai Yong
Published in: Asian Test Symposium (2013)
Keyphrases
  • neural network
  • single chip
  • image processing
  • multiscale
  • higher order
  • image quality