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Generation of monitoring functions in production automation using test specifications.
Suhyun Cha
Sebastian Ulewicz
Birgit Vogel-Heuser
Alexander Weigl
Mattias Ulbrich
Bernhard Beckert
Published in:
INDIN (2017)
Keyphrases
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high level
monitoring system
basis functions
real time
statistical significance
early warning
production cost
delay insensitive
data mining
case study
generation method
production process
semiconductor manufacturing