An Algorithm for the Genaration of Test Sets for Conmbinational Logic Networks.
David T. WangPublished in: IEEE Trans. Computers (1975)
Keyphrases
- test set
- dynamic programming
- detection algorithm
- times faster
- search space
- learning algorithm
- computational complexity
- cost function
- objective function
- segmentation algorithm
- experimental evaluation
- error rate
- preprocessing
- optimal solution
- neural network
- matching algorithm
- noisy data
- probabilistic model
- k means
- bayesian networks
- high accuracy
- simulated annealing
- expectation maximization
- optimization algorithm
- np hard
- search algorithm
- training data
- genetic algorithm