Boosting the Memory Window of the BEOL-Compatible MFMIS Ferroelectric/ Anti-Ferroelectric FETs by Charge Injection.
Zijie ZhengChen SunLeming JiaoDong ZhangZuopu ZhouXiaolin WangGan LiuQiwen KongYue ChenKai NiXiao GongPublished in: VLSI Technology and Circuits (2022)