Model-to-Circuit Cross-Approximation For Printed Machine Learning Classifiers.
Giorgos ArmeniakosGeorgios ZervakisDimitrios SoudrisMehdi B. TahooriJörg HenkelPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2023)
Keyphrases
- machine learning
- statistical model
- computational model
- learning models
- training data
- machine learning algorithms
- mathematical model
- pattern recognition
- probabilistic model
- probability distribution
- theoretical analysis
- parameter estimation
- statistical methods
- learning tasks
- machine learning approaches
- machine learning models