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Process variation in nano-scale memories: failure analysis and process tolerant architecture.

Amit AgarwalBipul C. PaulKaushik Roy
Published in: CICC (2004)
Keyphrases
  • database
  • data sets
  • databases
  • real world
  • genetic algorithm
  • artificial intelligence
  • wide range
  • data analysis
  • management system
  • statistical analysis
  • petri net
  • quantitative analysis