RT Level vs. Microarchitecture-Level Reliability Assessment: Case Study on ARM(R) Cortex(R)-A9 CPU.
Athanasios ChatzidimitriouManolis KaliorakisDimitris GizopoulosMaurizio IacarusoMauro PipponziRiccardo MarianiStefano Di CarloPublished in: DSN Workshops (2017)