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Improved current filament control during Zener diode zapping.

Jaume RoigJulien LebonSteven VandewegheSamir MouhoubiFilip Bauwens
Published in: Microelectron. Reliab. (2012)
Keyphrases
  • control system
  • improved algorithm
  • control theory
  • real time
  • machine learning
  • genetic algorithm
  • multiscale
  • computer simulation