Modeling the gate-related high-frequency and noise characteristics of deep-submicron MOSFETs.
Rainer KrausGerhard KnoblingerPublished in: CICC (2002)
Keyphrases
- high frequency
- low frequency
- visual quality
- high resolution
- wavelet transform
- subband
- high frequencies
- wavelet decomposition
- high frequency components
- discrete wavelet transform
- low pass
- frequency band
- low bit rate coding
- multiscale
- phase shifting
- wavelet coefficients
- multiresolution
- blocking artifacts
- wavelet domain
- image data