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The True Cost of Errors in Emerging Memory Devices: A Worst-Case Analysis of Device Errors in IMC for Safety-Critical Applications.

Alptekin VardarLi ZhangSaiyam Bherulal JainShaown MojumderNellie LaleniSourav DeThomas Kämpfe
Published in: SMACD (2023)
Keyphrases
  • worst case analysis
  • safety critical
  • real time
  • mobile devices
  • upper bound
  • worst case
  • machine learning
  • learning algorithm
  • low cost
  • average case
  • formal methods