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Metric Selection for Software Defect Prediction.

Huanjing WangTaghi M. KhoshgoftaarJason Van HulseKehan Gao
Published in: Int. J. Softw. Eng. Knowl. Eng. (2011)
Keyphrases
  • software defect prediction
  • software defect
  • ensemble learning
  • class imbalance
  • data sets
  • neural network
  • selection algorithm
  • sample selection bias
  • active learning