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DeepTest: How Machine Learning Can Improve the Test of Embedded Systems.
Jens Bielefeldt
Kai-Uwe Basener
Siddique Reza Khan
Mozhdeh Massah
Hans-Werner Wiesbrock
Stefan Scharoba
Michael Hübner
Published in:
MECO (2021)
Keyphrases
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embedded systems
machine learning
embedded software
low cost
computing power
processing power
embedded devices
real time systems
resource limited
real time image processing
software systems
field programmable gate array
cooperative
open source
case study
real world
artificial intelligence
consumer electronics