SRAM for Error-Tolerant Applications With Dynamic Energy-Quality Management in 28 nm CMOS.
Fabio FrustaciMahmood KhayatzadehDavid T. BlaauwDennis SylvesterMassimo AliotoPublished in: IEEE J. Solid State Circuits (2015)
Keyphrases
- error tolerant
- quality management
- power consumption
- data quality
- cmos technology
- fuzzy theory
- low power
- graph matching
- project management
- quality assessment
- service quality
- water quality
- quality improvement
- low voltage
- database
- association patterns
- information systems
- neural network
- service providers
- subgraph isomorphism
- itemsets
- object recognition