Login / Signup
Development of a standard for transient measurement of junction-to-case thermal resistance.
Heinz Pape
Dirk Schweitzer
Liu Chen
Rudolf Kutscherauer
Martin Walder
Published in:
Microelectron. Reliab. (2012)
Keyphrases
</>
infrared
knowledge based systems
rapid development
database
data sets
software engineering
neural network
machine learning
decision support
expert systems
object oriented
information processing
steady state
project management
power plant