Using Embedded Feature Selection and CNN for Classification on CCD-INID-V1 - A New IoT Dataset.
Zhipeng LiuNiraj ThapaAddison ShaverKaushik RoyMadhuri SiddulaXiaohong YuanAnna YuPublished in: Sensors (2021)
Keyphrases
- feature selection
- feature set
- classification accuracy
- text classification
- support vector
- support vector machine
- fold cross validation
- classification models
- machine learning
- feature extraction
- pattern recognition
- benchmark datasets
- discriminative features
- class separability
- accurate classification
- unsupervised learning
- irrelevant features
- classification performances
- feature space
- image classification
- model selection
- neural network
- feature subset
- bayes classifier
- convolutional neural network
- feature ranking
- data pre processing
- training dataset
- mutual information
- decision trees
- feature vectors
- management system
- dimensionality reduction
- class labels
- svm classifier
- classification method
- class imbalance
- support vector machine svm
- text categorization
- microarray data
- microarray datasets
- extracted features
- feature selection algorithms
- uci datasets
- high resolution
- cross validation
- training set
- feature selection and classification