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Use of a field programmable gate array for education in manufacturing test and automatic test equipment.

Dirk NiggemeyerKevin J. StephanoElizabeth M. Rudnick
Published in: IEEE Trans. Educ. (2001)
Keyphrases
  • machine learning
  • pattern recognition
  • query processing
  • stereo matching
  • associative memory
  • field programmable gate array