Login / Signup

Circuit failure prediction to overcome scaled CMOS reliability challenges.

Subhasish MitraMridul Agarwal
Published in: ITC (2007)
Keyphrases
  • failure prediction
  • circuit design
  • high speed
  • analog vlsi
  • delay insensitive
  • lessons learned
  • low voltage
  • cmos technology
  • vlsi circuits
  • power consumption
  • multiresolution
  • chip design
  • low cost
  • image analysis