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Detecting Transistor Defects in Medical Systems Using a Multi Model Ensemble of Convolutional Neural Networks.
Hüsnü Murat Koçak
Ahmet Teoman Naskali
Özgün Pinarer
Jérôme Mitard
Published in:
IEEE BigData (2021)
Keyphrases
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computational model
management system
mathematical model
statistical model
probabilistic model
information systems
high level
training set
prior knowledge
distributed systems
knowledge based systems
experimental data
computational models