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Yield Management: Editorial Introduction.

Ian YeomanAnthony IngoldSheryl E. Kimes
Published in: J. Oper. Res. Soc. (1999)
Keyphrases
  • yield management
  • special issue
  • finite horizon
  • neural network
  • information systems
  • database
  • data sets
  • real world
  • information retrieval
  • computer vision
  • three dimensional
  • sufficient conditions