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A Sequential Bayesian Approach for Remaining Useful Life Prediction of Dependent Competing Failure Processes.
Mengfei Fan
Zhiguo Zeng
Enrico Zio
Rui Kang
Ying Chen
Published in:
IEEE Trans. Reliab. (2019)
Keyphrases
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prediction accuracy
failure prediction
prediction model
databases
mining sequential
prediction algorithm
process model
failure detection
machine learning
hidden markov models
long term
computational models
expert systems
prediction error
image sequences
success or failure
high prediction accuracy
data sets