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A Physical Threshold Voltage Model of Nanoscale Ultra-thin Body Ultra-thin Box SOI MOSFETs with a Gaussian Doping Profile.
Hongxia Chen
Sufen Wei
Jing Liu
Guohe Zhang
Cheng-Fu Yang
Published in:
ICKII (2019)
Keyphrases
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high level
management system
mathematical model
formal model
theoretical analysis
computational model
statistical model
conceptual model
data sets
prior knowledge
em algorithm
parameter estimation
power system
theoretical framework
experimental data
bayesian framework