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An Empirical Model for the Threshold Voltage of Enhancement NMOSFET's.
Hong-June Park
Choong-Ki Kim
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1985)
Keyphrases
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management system
theoretical analysis
mathematical model
high level
cost function
probability distribution
input data
computational model
theoretical framework
process model
conceptual model
sensitivity analysis
machine learning
information systems
prior knowledge
statistical model