Combined application of Power Spectrum Centroid and Support Vector Machines for measurement improvement in Optical Scanning Systems.
Wendy Flores-FuentesMoises Rivas-LópezOleg SergiyenkoFélix F. González-NavarroJavier Rivera-CastilloDaniel Hernandez BalbuenaJulio C. Rodríguez-QuiñonezPublished in: Signal Process. (2014)