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Non-Deterministic DUT Behavior During Functional Testing of High Speed Serial Busses: Challenges and Solutions.
Jonathan Hops
Brian Swing
Brian Phelps
Bruce Sudweeks
John Pane
James Kinslow
Published in:
ITC (2004)
Keyphrases
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high speed
optimal solution
databases
low power
lessons learned
frame rate
specific problems
practical solutions
computational issues
real world
solution quality
black box
behavior patterns
case study
image segmentation
data mining
neural network
data sets