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Novel 15T SRAM Cell for Low Voltage High Reliability Application.

Yongkang HanYulin ZhaoQiao HuXuanzhi LiuBo PengHaijun JiangJianguo YangXiaoyong Xue
Published in: ASICON (2021)
Keyphrases
  • high reliability
  • low voltage
  • low cost
  • high precision
  • random access memory
  • computer vision
  • image sequences
  • cost effective