An error analysis for deep binary classification with sigmoid loss.
Changshi LiYuling JiaoJerry Zhijian YangPublished in: Inf. Sci. (2024)
Keyphrases
- error analysis
- binary classification
- multi class
- learning problems
- support vector
- cost sensitive
- least squares
- multi label
- multi class classification
- error correction
- support vector machine
- generalization error
- binary classifiers
- convex loss functions
- prediction accuracy
- ensemble methods
- learning algorithm
- class imbalance
- image classification
- active learning
- cross validation
- pairwise
- reinforcement learning
- bayesian networks
- computer vision