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A percolation study of RTS noise amplitudes in nano-MOSFETs by Monte Carlo simulation.

Zhongfa MaPeng ZhangYong WuWeihua LiYiqi ZhuangLei Du
Published in: Microelectron. Reliab. (2010)
Keyphrases
  • monte carlo simulation
  • monte carlo
  • markov chain
  • data sets
  • theoretical framework
  • information systems
  • statistical analysis
  • signal to noise ratio
  • reinforcement learning
  • multiple regression