Login / Signup

Optimizing Durian Chip Quality Using Machine Learning: Multiple Linear Regression for Predicting Inputs in Microwave-Hot Air Drying Process.

Sakraan SitcharangsieSuwit Paengkanya
Published in: IEEM (2023)
Keyphrases
  • machine learning
  • multiple linear regression
  • pattern recognition
  • input variables
  • case study
  • support vector machine
  • least squares