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Exploring the Interaction Between Device Lifetime Reliability and Security Vulnerabilities.

Chen-Han HoGarret StausAaron UllmerKaru Sankaralingam
Published in: IEEE Comput. Archit. Lett. (2011)
Keyphrases
  • security vulnerabilities
  • intrusion detection
  • dos attacks
  • penetration testing
  • security properties
  • data warehouse
  • energy consumption
  • network traffic