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Improving Combinational Circuit Reliability Against Multiple Event Transients via a Partition and Restructuring Approach.

Mohammad Reza RohanipoorBehnam GhavamiMohsen Raji
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2020)
Keyphrases
  • high speed
  • genetic algorithm
  • event driven
  • partitioning algorithm
  • logic circuits
  • real time
  • data sets
  • information retrieval
  • learning algorithm
  • similarity measure
  • low power
  • multi channel
  • electronic circuits