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Improving Combinational Circuit Reliability Against Multiple Event Transients via a Partition and Restructuring Approach.
Mohammad Reza Rohanipoor
Behnam Ghavami
Mohsen Raji
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2020)
Keyphrases
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high speed
genetic algorithm
event driven
partitioning algorithm
logic circuits
real time
data sets
information retrieval
learning algorithm
similarity measure
low power
multi channel
electronic circuits