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Contrast improvement with Diffraction Enhanced Imaging for scattering materials.
Fulvia Arfelli
Ralf-Hendrik Menk
Hans-Jürgen Besch
Luigi Rigon
Hartmute Plothow-Besch
Published in:
ISBI (2002)
Keyphrases
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x ray
image processing
medical imaging
signal processing
imaging systems
high resolution
electron microscope
computer vision
infrared
image segmentation
image sequences
super resolution
acquired images
mechanical properties
imaging process