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Interconnect crosstalk noise evaluation in deep-submicron technologies.
Xiaoxiao Liu
Guangsheng Ma
Jingbo Shao
Zhi Yang
Guanjun Wang
Published in:
Microelectron. Reliab. (2009)
Keyphrases
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vlsi circuits
real time
data mining
high speed
evaluation method
noise level
evaluation criteria
evaluation methods
digital libraries
user interface
noisy data
signal to noise ratio
noise reduction
low power
evaluation process
noise free