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Cell in 65 nm Technology Utilizing Self-Write-Back Sense Amplifier and Cascaded Bit Line Scheme.

Keiichi KushidaAzuma SuzukiGou FukanoAtsushi KawasumiOsamu HirabayashiYasuhisa TakeyamaTakahiko SasakiAkira KatayamaYuki FujimuraTomoaki Yabe
Published in: IEEE J. Solid State Circuits (2009)
Keyphrases
  • nm technology
  • real time
  • power consumption
  • dynamic range
  • input output
  • low power
  • pseudorandom
  • protection scheme