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Analysis of the role of the parasitic BJT of Super-Junction power MOSFET under TLP stress.
Tudor Chirila
Winfried Kaindl
T. Reimann
Michael Rüb
U. Wahl
Published in:
Microelectron. Reliab. (2015)
Keyphrases
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high level
pattern recognition
data analysis
image analysis
control system
information retrieval
computer vision
decision making
metadata
mobile devices
power consumption
quantitative analysis