Login / Signup

Analysis of the role of the parasitic BJT of Super-Junction power MOSFET under TLP stress.

Tudor ChirilaWinfried KaindlT. ReimannMichael RübU. Wahl
Published in: Microelectron. Reliab. (2015)
Keyphrases
  • high level
  • pattern recognition
  • data analysis
  • image analysis
  • control system
  • information retrieval
  • computer vision
  • decision making
  • metadata
  • mobile devices
  • power consumption
  • quantitative analysis