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Model-Based 2.5-D Deconvolution for Extended Depth of Field in Brightfield Microscopy.

François AguetDimitri Van De VilleMichael Unser
Published in: IEEE Trans. Image Process. (2008)
Keyphrases
  • image analysis
  • high resolution
  • depth map
  • graduate students
  • database
  • neural network
  • least squares
  • denoising
  • motion blur