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A New RF SiCMOS SDD Model for Quantifying Individual Contribution to Distortion from Transistor's Nonlinear Parameters.
Ali Abuelmaatti
Iain Thayne
Published in:
ICECS (2006)
Keyphrases
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mathematical model
parameter values
high order
experimental data
computational model
parameter estimation
nonlinear regression
measured data
least squares
management system
probability distribution
objective function
low cost
statistical model
prior knowledge
linear model
nonlinear dynamics
learning algorithm