Non-destructive estimation method on cosmic ray ruggedness of power semiconductors using repetitive monitoring technique.
C. KawaharaY. WadaS. KinouchiH. KobayashiPublished in: Microelectron. Reliab. (2018)
Keyphrases
- estimation accuracy
- high precision
- parameter estimation
- high accuracy
- optimization method
- segmentation method
- detection method
- data sets
- computational cost
- dynamic programming
- prior knowledge
- pairwise
- similarity measure
- support vector machine
- principal component analysis
- support vector machine svm
- optimization algorithm
- detection algorithm
- feature space
- synthetic data
- computational complexity
- classification method
- power consumption
- image processing
- feature selection