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Degradation behavior and mechanism of polymer films for high-ohmic resistor protection in a heat and humid environment.
X. Y. Wang
H. Zhang
X. P. Ma
Q. Cheng
C. G. Li
M. X. Li
T. N. Chen
P. Zhang
J. Q. Shao
Published in:
Microelectron. Reliab. (2016)
Keyphrases
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