A data mining approach for analyzing semiconductor MES and FDC data to enhance overall usage effectiveness (OUE).
Chen-Fu ChienAlejandra Campero DiazYu-Bin LanPublished in: Int. J. Comput. Intell. Syst. (2014)
Keyphrases
- training data
- data analysis
- data sets
- data collection
- raw data
- data structure
- original data
- data points
- database
- data distribution
- application domains
- image data
- missing data
- data quality
- big data
- missing values
- usage patterns
- high dimensional
- high quality
- data processing
- data management
- high dimensional data
- small number
- sensor data
- knowledge discovery
- probability distribution
- data sources
- prior knowledge
- neural network
- complex data
- databases